Since 2020, aggregated from related topics
Structured illumination microscopy (SIM) is a super-resolution microscopy technique that improves resolution beyond the diffraction limit of conventional microscopy. It achieves this by projecting a structured illumination pattern onto the sample, which creates moiré fringes when combined with the emitted light. By analyzing these patterns, SIM can provide higher resolution images with greater clarity and detail compared to traditional microscopy techniques. This method has been widely used in biological imaging to study cellular structures and dynamics at the nanoscale level.